Investigation of the Casimir force between metal and semiconductor test bodies
arXiv:quant-ph/0505003 · doi:10.1103/PhysRevA.72.020101
Abstract
The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be significantly different than between two similar or dissimilar metals.
9 pages, 3 figures; minor abbreviations in the text were made; accepted for publication in Phys. Rev. A (Rapid Communications)