Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

Abstract

Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.

For LINAC 2000 Conference, Monterey, 21-25 August 2000 Paper no. MOC08 Second PostScript version to replace first PostScript version in which caption to Fig. 1 overflowed on to second page