Scanned Potential Microscopy of Edge States in a Quantum Hall Liquid
arXiv:cond-mat/9911358 · doi:10.1016/S1386-9477(99)00115-0
Abstract
Using a low-temperature atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a quantum Hall conductor in the presence of a gate-induced non-equilibrium edge state population at n=3. We observe sharp voltage drops at the sample edges which are suppressed by re-equilibrating the edge states.
4 pages, 4 figs. To be published in Physica E (Proceedings of the 13th International Conference on the Properties of 2D Systems)