A Transport Analysis of the BEEM Spectroscopy of Au/Si Schottky Barriers
arXiv:cond-mat/9710151 · doi:10.1002/1521-3951(199711)204:1<397::AID-PSSB397>3.0.CO
Abstract
A systematic transport study of the ballistic electron emission microscopy (BEEM) of Au/Si(100) and Au/Si(111) Schottky barriers for different thicknesses of the metal layer and different temperatures is presented. It is shown that the existing experimental data are compatible with a recently predicted bandstructure-induced non-forward electron propagation through the Au(111) layer.
5 pages, Latex-APS, 1 postscript figure, http://www.icmm.csic.es/Pandres/pedro.htm. Phys. Stat. Sol. (b) (to appear), HCIS-10 Conf, Berlin 1997