Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width
arXiv:cond-mat/0702262
Abstract
The anisotropic broadening of ZrSiO4 sample is modelled using the Stephens's phenomenological model for anisotropic line broadening and the three dimensional strain distribution in the sample is plotted. The micro-structural parameters like domain size and dislocation density are estimated using the variance method.
Presented at European Powder Diffraction Conference (EPDIC 10), Geneva