Microscopic Model of Critical Current Noise in Josephson Junctions
arXiv:cond-mat/0612410 · doi:10.1103/PhysRevLett.99.207001
Abstract
We present a simple microscopic model to show how fluctuating two--level systems in the Josephson junction tunnel barrier of thickness $L$ can modify the potential energy of the barrier and produce critical current noise spectra. We find low frequency $1/f$ noise that goes as $L^5$. Our values are in good agreement with recent experimental measurements of critical current noise in Al/AlO$_{x}$/Al Josephson junctions. We also investigate the sensitivity of the noise on the nonuniformity of the tunnel barrier.
4 pages, 3 figures