Pulsed Laser Deposition of a PBN:65 Morphotropic Phase Boundary Thin Film with Large Electrostriction
arXiv:cond-mat/0501027 · doi:10.2478/BF02475585
Abstract
We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 um2/V2, and it is consistent with what we measured in the reflection experiment.
16 pages, 5 figures. Accepted for publication with CEJP, with re writes of document pending final Editorial board (of CEJP) final approval