A model of transport nonuniversality in thick-film resistors
arXiv:cond-mat/0307141 · doi:10.1063/1.1590733
Abstract
We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as consequence of wide distribution of interparticle tunneling distances.
3 pages, 1 figure