A Novel Broadband Measurement Method for the Magnetoimpedance of Ribbons and Thin Films
arXiv:cond-mat/0305259 · doi:10.1016/j.jmmm.2003.12.1372
Abstract
A novel broad-band measurement method of the MI in thin films and ribbons is presented. It is based on the automated measurement of the reflection coefficient of a cell loaded with the sample. Illustrative results obtained with a permalloy multilayer thin film are presented and discussed.
Paper submitted to International Conference on Magnetism (Rome 2003)