The depinning transition of a driven interface in the random-field Ising model around the upper critical dimension

Abstract

We investigate the depinning transition for driven interfaces in the random-field Ising model for various dimensions. We consider the order parameter as a function of the control parameter (driving field) and examine the effect of thermal fluctuations. Although thermal fluctuations drive the system away from criticality the order parameter obeys a certain scaling law for sufficiently low temperatures and the corresponding exponents are determined. Our results suggest that the so-called upper critical dimension of the depinning transition is five and that the systems belongs to the universality class of the quenched Edward-Wilkinson equation.

accepted for publication in Phys. Rev. E