Cross sections of X-ray production induced by C and Si ions with energies up to 1 MeV/u on Ti, Fe, Zn, Nb, Ru and Ta
arXiv:1611.09282 · doi:10.1016/j.nimb.2017.01.047
Abstract
X-ray production differential cross sections induced by C and Si ions with energies from 1 MeV/u down to 0.25 MeV/u, produced by the CMAM 5 MV tandem accelerator, have been measured for thin targets of Ti, Fe, Zn, Nb, Ru and Ta in a direct way. X-rays have been detected by a fully characterized silicon drift diode and beam currents have been measured by a system of two Faraday cups. Measured cross sections agree in general with previously published results. The ECPSSR theory with the united atoms correction gives absolute values close to the experimental ones for all the studied elements excited by C ions and for Ta, Nb and Ru excited by Si ions. For Ti, Fe and Zn excited by Si, the basic ECPSSR theory gives better agreement, although on absolute values the gap for Ti is still large.
11 pages, 2 tables, 7 figures. Contribution to the 12th. European Conference on Accelerators in Applied Research and Technology (ECAART 12) held in Jyväskylä, Finland, 3-8 July 2016