Blind fluorescence structured illumination microscopy: A new reconstruction strategy
arXiv:1601.07851 · doi:10.1109/ICIP.2016.7532943
Abstract
In this communication, a fast reconstruction algorithm is proposed for fluorescence \textit{blind} structured illumination microscopy (SIM) under the sample positivity constraint. This new algorithm is by far simpler and faster than existing solutions, paving the way to 3D and/or real-time 2D reconstruction.
submitted to IEEE ICIP 2016