Improved time-interval analysis
arXiv:1308.2806 · doi:10.1016/j.nima.2013.10.010
Abstract
Several extensions of the halflife analysis method recently suggested by Horvat and Hardy are put forward. Goodness-of-fit testing is included, and the method is extended to cases where more information is available for each decay event which allows applications also for e.g. $γ$ decay data. The results are tested with Monte Carlo simulations and are applied to the decays of $^{64}$Cu and $^{56}$Mn.
16 pages, 3 figures