Angular dependence of the Hall effect of lsmo films

Abstract

We find that the Hall effect resistivity ($ρ_{xy}$) of thin films of \lsmo\ varies as a function of the angle $θ$ between the applied magnetic field and the film normal as $ρ_{xy}=a\cos θ+ b\cos 3θ$, where $|b|$ increases with increasing temperature and decreases with increasing magnetic field. We find that the angular dependence of the longitudinal resistivity and the magnetization cannot fully explain the surprising term $b$, suggesting it is a manifestation of an intrinsic transport property.