Self-calibrating Tomography for Angular Schmidt Modes in Spontaneous Parametric Down-Conversion
arXiv:1112.3806 · doi:10.1103/PhysRevA.87.042109
Abstract
We report an experimental self-calibrating tomography scheme for entanglement characterization in high-dimensional quantum systems using Schmidt decomposition techniques. The self-tomography technique based on maximal likelihood estimation was developed for characterizing non-ideal measurements in Schmidt basis allowing us to infer both Schmidt eigenvalues and detecting efficiencies.
10 pages, 11 figures