Defect production due to quenching through a multicritical point and along a gapless line

Abstract

In this review, we study the quenching dynamics of a one-dimensional XY Hamiltonian in a transverse field under linear variation of different parameters of the Hamiltonian so that the system is driven through various critical points and gapless lines. It is observed that the density of defects falls off as a power law with the quenching rate $1/τ$ where the power law is determined by the dimensionality of the underlying lattice and the critical exponents associated with the quantum critical point as predicted by Kibble-Zurek scaling. However, we show that when the system is driven through a multicritical point or along a gapless line, Kibble Zurek scaling needs to be modified. We discuss generalized scaling forms of the defect density for the above two situations.

16 pages, 7 figures, an updated version will be published in "Quantum Quenching, Annealing and Computation", Eds. A. Das, A. Chandra and B. K. Chakrabarti, Lect. Notes in Phys., Springer, Heidelberg (2009, to be published)