Thickness dependence of the mobility at the LaAlO_3 / SrTiO_3 interface
arXiv:0902.3535 · doi:10.1063/1.3149695
Abstract
The electronic transport properties of a series of LaAlO_3 / SrTiO_3 interfaces were investigated, and a systematic thickness dependence of the sheet resistance and magnetoresistance was found for constant growth conditions. This trend occurs above the critical thickness of four unit cells, below which the LaAlO_3 / SrTiO_3 interface is not conducting. A dramatic decrease in mobility of the electron gas of nearly two orders of magnitude was observed with increasing LaAlO_3 thickness from five to 25 unit cells.
3 pages, 4 figures, submitted for publication