Setup for shot noise measurements in carbon nanotubes

Abstract

We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 - 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non-matching conditions can be tolerated.

2 pages, 2 figures, published on AIP conference proceedings 2006