Modelling Thickness-Dependence of Ferroelectric Thin Film Properties
arXiv:0704.2752 · doi:10.1103/PhysRevB.76.014112
Abstract
We present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a "smoking gun" benchtop probe to test our elastic scenario.
13 pages, 17 figures