papers
Publications (5)
physics.ins-det2016
Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode
P. Olivero, J. Forneris, P. Gamarra +6
cond-mat.mtrl-sci2016
Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
E. Vittone, Z. Pastuovic, P. Olivero +5
physics.ins-det2016
Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes
P. Olivero, J. Forneris, M. Jaksic +4
cond-mat.mtrl-sci2016
Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization
P. Olivero, G. Amato, F. Bellotti +10
physics.ins-det2016
Charge collection efficiency mapping of interdigitated 4H-SiC detectors
E. Vittone, N. Skukan, Z. Pastuovic +2