NewEvery arXiv paper, its researchers & institutions — mapped.
papers

Publications (2)

physics.ins-det2016

The influence of edge effects on the determination of the doping profile of silicon pad diodes

M. Hufschmidt, E. Fretwurst, E. Garutti +3

physics.ins-det2017

Determination of the p-spray profile for n+p silicon sensors using a MOSFET

E. Fretwurst, E. Garutti, R. Klanner +3