Publications (16)
The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholén +1
Determining surface properties with bimodal and multimodal AFM
Daniel Forchheimer, Stanislav S. Borysov, Daniel Platz +1
On modeling and measuring viscoelasticity with dynamic Atomic Force Microscopy
Per-Anders Thorén, Riccardo Borgani, Daniel Forchheimer +7
Background force compensation in dynamic atomic force microscopy
Riccardo Borgani, Per-Anders Thorén, Daniel Forchheimer +4
Intermodulation electrostatic force microscopy for imaging surface photo-voltage
Riccardo Borgani, Daniel Forchheimer, Jonas Bergqvist +3
Interaction imaging with amplitude-dependence force spectroscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholen +1
Calibrating torsional eigenmodes of micro cantilevers for dynamic measurement of frictional forces
Per-Anders Thorén, Riccardo Borgani, Daniel Forchheimer +1
Tip-surface interactions in dynamic atomic force microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholén +1
Simultaneous quantitative imaging of surface and magnetic forces
Daniel Forchheimer, Daniel Platz, Erik A. Tholen +1
Reconstruction of Tip-Surface Interactions with Multimodal Intermodulation Atomic Force Microscopy
Stanislav S. Borysov, Daniel Platz, Astrid S. de Wijn +4
Effect of material stiffness on intermodulation response in dynamic atomic force microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholén +2
Interpreting motion and force for narrow-band intermodulation atomic force microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholén +1
Imaging high-speed friction at the nanometer scale
Per-Anders Thorén, Astrid S. de Wijn, Riccardo Borgani +2
Dynamic Calibration of Higher Eigenmode Parameters of a Cantilever in Atomic Force Microscopy Using Tip-Surface Interactions
Stanislav S. Borysov, Daniel Forchheimer, David B. Haviland
Polynomial force approximations and multifrequency atomic force microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholen +1
The Intermodulation Lockin Analyzer
Erik A. Tholen, Daniel Platz, Daniel Forchheimer +4